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Your search returned 30 records. Click on the hyperlinks to view further details of Titles.. |
Magazine Name : Ieee Transactions On Electron Devices
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Year : 2004 Volume number : 51 Issue: 10 |
Impact Of Compositionally Graded Base Regions On The Dc And Rf Properties Of Reduced Turn-On Voltage Ingap-Galnasn Dhbts
(Article)
Subject:
Bipolar Transistor
,
Gainasn
Author:
Kevin S
Stevens
Rebecca J
Welty
Roger E
Welser
page:
1545
-
1553
Surface-Related Drain Current Dispersion Effects In Algan-Gan Hemts
(Article)
Subject:
Device Simulation
,
Current Collapse
Author:
G
Meneghesso
Claudio
Canali
Alessandro
Chini
page:
1554
-
1561
Opto-Electronic Properties Of Poly (Fluorene) Co-Polymer Red Light-Emitting Devices On Flexible Plastic Substrate
(Article)
Subject:
Plastic Substrate
,
Multilayer Structure
Author:
Yongtaek
Hong
Jerzy
Kanicki
page:
1562
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1569
Investigation Of The Energy Distribution Of Stress-Induced Oxide Traps By Numerical Analysis Of The Tat Of Hes
(Article)
Subject:
Trap Energy Distribution
Author:
Francesco
Driussi
Romano
Iob
Luca
Selmi
page:
1570
-
1576
Modeling The Electrical Effects Of Metal Dishing Due To Cmp For On-Chip Interconnect Optimization
(Article)
Subject:
Erosion
,
Metal Dishing
Author:
Runzi
Chang
Yu
Cao
Costas J
Spanos
page:
1577
-
1583
Successive Oxide Breakdown Statistics Correlation Effects, Reliability Methodologies And Their Limits
(Article)
Subject:
Mos Devices
,
Reliability Theory
Author:
Jordi
Sune
Ernest Y
Wu
Wing L
Lai
page:
1584
-
1592
On The Physical Mechanism Of The Nrom Memory Erase
(Article)
Subject:
Flash Memories
,
Semiconductor Memories
Author:
Luca
Larcher
Paolo
Pavan
Boaz
Eitan
page:
1593
-
1599
On The Threshold Voltage Of Symmetrical Dg Mos Capacitor With Intrinsic Silicon Body
(Article)
Subject:
Threshold Voltage
,
Analytical Solution
Author:
Man
Wong
Xuejie
Shi
page:
1600
-
1604
Impact Of Downscaling On High-Frequency Noise Performance Of Bulk And Soi Mosfets
(Article)
Subject:
Process Optimization
,
High-Frequency Noise
Author:
Guillaume
Pailloncy
Christine
Raynaud
Gilles
Dambrine
page:
1605
-
1612
Erratic Cell Behavior In Channel Hot Electron Programming Of Nor Flash Memories
(Article)
Subject:
Flash
,
Programming
,
Memories
Author:
Marco
Grossi
Massimo
Lanzoni
Bruno
Ricco
page:
1613
-
1621
Cmos Circuit Performance Enhancement By Surface Orientation Optimization
(Article)
Subject:
Mobility
,
Surface Orientation
Author:
Leland
Chang
Meikei
Leong
page:
1621
-
1627
On-Chip Esd Protection Design With Substrate-Triggered Technique For Mixed-Voltage I/O Circuits In Subquarter-Micrometer Cmos Process
(Article)
Subject:
Electrostatic Discharge (Esd)
,
Esd Protection Circuit
Author:
Ming-Dou
Ker
Chien-Hui
Chuang
Kun-Hsien
Lin
page:
1628
-
1636
Statistical Simulations For Flash Memory Reliability Analysis And Prediction
(Article)
Subject:
Device Simulations
,
Flash Memories
Author:
Luca
Larcher
Paolo
Pavan
page:
1636
-
1643
A Unique Dual-Poly Gate Technology For 1.2-V Mobile Dram With Simple In Situ N-Doped Polysilicon
(Article)
Subject:
Retention Time
,
Tungsten Polycide
Author:
Nak-Jin
Son
Yongchul
Oh
Wouns
Yang
page:
1644
-
1652
Accurate Evaluation Of Mobility In High Gate-Leakage-Current Mosfets By Using A Transmission-Line Model
(Article)
Subject:
Mobility
,
Mosfets
,
Leakage Currents
Author:
Osamu
Tonomura
Hiroshi
Miki
Jiro
Yugami
page:
1653
-
1658
Efficient Thermal Modeling Of Soi Mosfets For Fast Dynamic Operation
(Article)
Subject:
Thermal Resistance
,
Thermal Capacitance
Author:
Jun
Lin
Min
Shen
Ming-C
Cheng
page:
1659
-
1666
Shrinkable Triple Self-Aligned Field-Enhanced Split-Gate Flash Memory
(Article)
Subject:
Flash Memory
,
Self-Aligned
Author:
Chung S
Wang
Wen-Ting
Chu
Yung-Tao
Lin
page:
1667
-
1671
Cycling Endurance Of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact Of Technological Parameters And Scaling
(Article)
Subject:
Hot Carriers
,
Device Scaling
Author:
Deleep R
Nair
S
Shukuri
S
Mahapatra
page:
1672
-
1679
Low-Frequency Noise In Submicrometer Mosfets With Hfo2, Hfo2/Al2o3 And Hfalo Gate Stacks
(Article)
Subject:
Flicker Noise
,
Mosfet
Author:
Bigang
Min
Philip J
Tobin
Fang
Wang
page:
1679
-
1687
Effects Of High Electric Fields And Temperature On Conductivity Of A-Si
(Article)
Subject:
High Electric Fields
,
Occupancy Function
Author:
Joze
Furlan
Slavko
Amon
Andrej
Levstek
page:
1688
-
1694
Moving Current Filaments In Integrated Dmos Transistors Under Short-Duration Current Stress
(Article)
Subject:
Bcd
,
Smart Power
Author:
Marie
Denison
Pavel
Rodin
Matej
Blaho
page:
1695
-
1703
Hot Hole Degradation Effects In Lateral Ndmos Transistors
(Article)
Subject:
Hot Carrier
,
Degradation
,
Ldmos
Author:
Peter
Moens
Marnix
Tack
Robin
Degraeve
page:
1704
-
1710
Investigations On The High Current Behavior Of Lateral Diffused High-Voltage Transistors
(Article)
Subject:
Power Integrated Circuits
,
Spice
Author:
Martin
Knaipp
Georg
Rohrer
Rainer
Minixhofer
page:
1711
-
1720
A Self-Aligned Process For High-Voltage, Short-Channel Vertical Dmosfets In 4h-Sic
(Article)
Subject:
Sic
,
Dmos
Author:
Maherin
Matin
Asmita
Saha
James A
Cooper
page:
1721
-
1725
Compact Modeling Of A Flash Memory Cell Including Substrate-Bias-Dependent Hot Electron Gate Current
(Article)
Subject:
Hot Carriers
,
Charge Injection
Author:
Taku
Ogura
Shinji
Kawai
Yasuo
Inoue
page:
1726
-
1730
Scr Device With Dynamic Holding Voltage For On-Chip Esd Protection In A 0.25-Um Fully Salicided Cmos Process
(Article)
Subject:
Electrostatic Discharge (Esd)
,
Holding Voltage
Author:
Ming-Dou
Ker
Zi-Ping
Chen
page:
1731
-
1732
A Comprehensive Study On The Fibl Of Nanoscale Mosfets
(Article)
Subject:
Mosfet
,
Stack Gate Dielectric
Author:
Bing-Yue
Tsui
Li-Feng
Chin
page:
1733
-
1735
Patterned N Implant Into Inp Substrate For Hbt Subcollector
(Article)
Subject:
Inp
,
Ion Implantation
Author:
Biqiang
Shi
Mary Y
Chen
Donald
Hitko
page:
1736
-
1739
Stress Management In Sub-90-Nm Transistor Architecture
(Article)
Subject:
Dielectric Films
,
Semiconductor Films
Author:
V
Banthia
N
Ingle
S
Yoon
page:
1740
-
1743
Nitride-Based Leds With Modulation-Doped Al0.12 Ga0.88 N-Gan Superlattice Structure
(Article)
Subject:
Electrostatic Discharge (Esd)
,
Current Spreading
Author:
T C
Wen
J K
Sheu
S J
Chang
page:
1743
-
1746
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