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Magazine Name : Ieee Transactions On Electron Devices

Year : 2004 Volume number : 51 Issue: 10

Impact Of Compositionally Graded Base Regions On The Dc And Rf Properties Of Reduced Turn-On Voltage Ingap-Galnasn Dhbts (Article)
Subject: Bipolar Transistor , Gainasn
Author: Kevin S Stevens      Rebecca J Welty      Roger E Welser     
page:      1545 - 1553
Surface-Related Drain Current Dispersion Effects In Algan-Gan Hemts (Article)
Subject: Device Simulation , Current Collapse
Author: G Meneghesso      Claudio Canali      Alessandro Chini     
page:      1554 - 1561
Opto-Electronic Properties Of Poly (Fluorene) Co-Polymer Red Light-Emitting Devices On Flexible Plastic Substrate (Article)
Subject: Plastic Substrate , Multilayer Structure
Author: Yongtaek Hong      Jerzy Kanicki     
page:      1562 - 1569
Investigation Of The Energy Distribution Of Stress-Induced Oxide Traps By Numerical Analysis Of The Tat Of Hes (Article)
Subject: Trap Energy Distribution
Author: Francesco Driussi      Romano Iob      Luca Selmi     
page:      1570 - 1576
Modeling The Electrical Effects Of Metal Dishing Due To Cmp For On-Chip Interconnect Optimization (Article)
Subject: Erosion , Metal Dishing
Author: Runzi Chang      Yu Cao      Costas J Spanos     
page:      1577 - 1583
Successive Oxide Breakdown Statistics Correlation Effects, Reliability Methodologies And Their Limits (Article)
Subject: Mos Devices , Reliability Theory
Author: Jordi Sune      Ernest Y Wu      Wing L Lai     
page:      1584 - 1592
On The Physical Mechanism Of The Nrom Memory Erase (Article)
Subject: Flash Memories , Semiconductor Memories
Author: Luca Larcher      Paolo Pavan      Boaz Eitan     
page:      1593 - 1599
On The Threshold Voltage Of Symmetrical Dg Mos Capacitor With Intrinsic Silicon Body (Article)
Subject: Threshold Voltage , Analytical Solution
Author: Man Wong      Xuejie Shi     
page:      1600 - 1604
Impact Of Downscaling On High-Frequency Noise Performance Of Bulk And Soi Mosfets (Article)
Subject: Process Optimization , High-Frequency Noise
Author: Guillaume Pailloncy      Christine Raynaud      Gilles Dambrine     
page:      1605 - 1612
Erratic Cell Behavior In Channel Hot Electron Programming Of Nor Flash Memories (Article)
Subject: Flash , Programming , Memories
Author: Marco Grossi      Massimo Lanzoni      Bruno Ricco     
page:      1613 - 1621
Cmos Circuit Performance Enhancement By Surface Orientation Optimization (Article)
Subject: Mobility , Surface Orientation
Author: Leland Chang      Meikei Leong     
page:      1621 - 1627
On-Chip Esd Protection Design With Substrate-Triggered Technique For Mixed-Voltage I/O Circuits In Subquarter-Micrometer Cmos Process (Article)
Subject: Electrostatic Discharge (Esd) , Esd Protection Circuit
Author: Ming-Dou Ker      Chien-Hui Chuang      Kun-Hsien Lin     
page:      1628 - 1636
Statistical Simulations For Flash Memory Reliability Analysis And Prediction (Article)
Subject: Device Simulations , Flash Memories
Author: Luca Larcher      Paolo Pavan     
page:      1636 - 1643
A Unique Dual-Poly Gate Technology For 1.2-V Mobile Dram With Simple In Situ N-Doped Polysilicon (Article)
Subject: Retention Time , Tungsten Polycide
Author: Nak-Jin Son      Yongchul Oh      Wouns Yang     
page:      1644 - 1652
Accurate Evaluation Of Mobility In High Gate-Leakage-Current Mosfets By Using A Transmission-Line Model (Article)
Subject: Mobility , Mosfets , Leakage Currents
Author: Osamu Tonomura      Hiroshi Miki      Jiro Yugami     
page:      1653 - 1658
Efficient Thermal Modeling Of Soi Mosfets For Fast Dynamic Operation (Article)
Subject: Thermal Resistance , Thermal Capacitance
Author: Jun Lin      Min Shen      Ming-C Cheng     
page:      1659 - 1666
Shrinkable Triple Self-Aligned Field-Enhanced Split-Gate Flash Memory (Article)
Subject: Flash Memory , Self-Aligned
Author: Chung S Wang      Wen-Ting Chu      Yung-Tao Lin     
page:      1667 - 1671
Cycling Endurance Of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact Of Technological Parameters And Scaling (Article)
Subject: Hot Carriers , Device Scaling
Author: Deleep R Nair      S Shukuri      S Mahapatra     
page:      1672 - 1679
Low-Frequency Noise In Submicrometer Mosfets With Hfo2, Hfo2/Al2o3 And Hfalo Gate Stacks (Article)
Subject: Flicker Noise , Mosfet
Author: Bigang Min      Philip J Tobin      Fang Wang     
page:      1679 - 1687
Effects Of High Electric Fields And Temperature On Conductivity Of A-Si (Article)
Subject: High Electric Fields , Occupancy Function
Author: Joze Furlan      Slavko Amon      Andrej Levstek     
page:      1688 - 1694
Moving Current Filaments In Integrated Dmos Transistors Under Short-Duration Current Stress (Article)
Subject: Bcd , Smart Power
Author: Marie Denison      Pavel Rodin      Matej Blaho     
page:      1695 - 1703
Hot Hole Degradation Effects In Lateral Ndmos Transistors (Article)
Subject: Hot Carrier , Degradation , Ldmos
Author: Peter Moens      Marnix Tack      Robin Degraeve     
page:      1704 - 1710
Investigations On The High Current Behavior Of Lateral Diffused High-Voltage Transistors (Article)
Subject: Power Integrated Circuits , Spice
Author: Martin Knaipp      Georg Rohrer      Rainer Minixhofer     
page:      1711 - 1720
A Self-Aligned Process For High-Voltage, Short-Channel Vertical Dmosfets In 4h-Sic (Article)
Subject: Sic , Dmos
Author: Maherin Matin      Asmita Saha      James A Cooper     
page:      1721 - 1725
Compact Modeling Of A Flash Memory Cell Including Substrate-Bias-Dependent Hot Electron Gate Current (Article)
Subject: Hot Carriers , Charge Injection
Author: Taku Ogura      Shinji Kawai      Yasuo Inoue     
page:      1726 - 1730
Scr Device With Dynamic Holding Voltage For On-Chip Esd Protection In A 0.25-Um Fully Salicided Cmos Process (Article)
Subject: Electrostatic Discharge (Esd) , Holding Voltage
Author: Ming-Dou Ker      Zi-Ping Chen     
page:      1731 - 1732
A Comprehensive Study On The Fibl Of Nanoscale Mosfets (Article)
Subject: Mosfet , Stack Gate Dielectric
Author: Bing-Yue Tsui      Li-Feng Chin     
page:      1733 - 1735
Patterned N Implant Into Inp Substrate For Hbt Subcollector (Article)
Subject: Inp , Ion Implantation
Author: Biqiang Shi      Mary Y Chen      Donald Hitko     
page:      1736 - 1739
Stress Management In Sub-90-Nm Transistor Architecture (Article)
Subject: Dielectric Films , Semiconductor Films
Author: V Banthia      N Ingle      S Yoon     
page:      1740 - 1743
Nitride-Based Leds With Modulation-Doped Al0.12 Ga0.88 N-Gan Superlattice Structure (Article)
Subject: Electrostatic Discharge (Esd) , Current Spreading
Author: T C Wen      J K Sheu      S J Chang     
page:      1743 - 1746